Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry

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Periodical:

Materials Science Forum (Volumes 228-231)

Edited by:

R.J. Cernik, R. Delhez and E.J. Mittemeijer

Pages:

171-176

DOI:

10.4028/www.scientific.net/MSF.228-231.171

Citation:

W. Pitschke "Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry", Materials Science Forum, Vols. 228-231, pp. 171-176, 1996

Online since:

July 1996

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