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HomeMaterials Science ForumMaterials Science Forum Vols. 228-231Application of a New Rietveld Software for...

Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

177-182

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.177

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Online since:

July 1996

Authors:

T. Taut, J. Bergmann, G. Schreiber, A. Börner, Eberhard Müller

Keywords:

Quantitative Analysis

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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