Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics

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Periodical:

Materials Science Forum (Volumes 228-231)

Edited by:

R.J. Cernik, R. Delhez and E.J. Mittemeijer

Pages:

177-182

DOI:

10.4028/www.scientific.net/MSF.228-231.177

Citation:

T. Taut et al., "Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics", Materials Science Forum, Vols. 228-231, pp. 177-182, 1996

Online since:

July 1996

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$35.00

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