Ab Initio Calculations of Diffraction Patterns of Submicron Powders
p.39
p.39
Addition Method in the Quantitative Analysis: Dependence of Error on the Quantity of Additive
p.43
p.43
DOP-FIT Method for Quantitative Analysis of Multicomponent Powders
p.49
p.49
Quantitative X-Ray Phase Analysis of Materials with Disordered Structures
p.55
p.55
A New Possibility for Powder Diffraction: The Characterization of the Domain Microstructure in a Ferroelectric Material
p.59
p.59
X-Ray and Neutron Analysis of the Dislocation Content in Plastically Deformed β-Brass
p.67
p.67
The Cross Correlation Method: A Useful Tool for Peak Shift Determination in XSE
p.73
p.73
Empirical Texture Correction for Different Diffraction Geometrics: Experimental Tests
p.77
p.77
New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
p.83
p.83
A New Possibility for Powder Diffraction: The Characterization of the Domain Microstructure in a Ferroelectric Material
Abstract:
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Periodical:
Materials Science Forum (Volumes 228-231)
Pages:
59-66
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Online since:
July 1996
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© 1996 Trans Tech Publications Ltd. All Rights Reserved
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