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HomeMaterials Science ForumMaterials Science Forum Vols. 228-231X-Ray Strain Analysis of Quenched and Ground...

X-Ray Strain Analysis of Quenched and Ground Alumina Samples

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

851-854

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.851

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Online since:

July 1996

Authors:

N. Ganev, Galina Gosmanová, Ivo Kraus

Keywords:

Aluminum (Al), Engineering Ceramic, Grinding, Penetration of X-Rays, Quenching, Residual Stress, Stress Gradients, X-Ray Diffraction (XRD)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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