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Materials Science Forum Vols. 228-231

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231

ToC:

Table of Contents

Paper Title Page

Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry
Authors: W. Pitschke
171
Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics
Authors: T. Taut, J. Bergmann, G. Schreiber, A. Börner, Eberhard Müller
177
An Interactive Windows Program for Profile Fitting and Size/Strain Analysis
Authors: S. Krumm
183
Strain Scanning Using X-Rays and Neutrons
Authors: P.J. Webster
191
Resonant Powder X-Ray Diffraction
Authors: J.P. Attfield
201
The Breadth and Shape of Instrumental Line Profiles for the Powder Diffraction Station 2.3 at the Daresbury Laboratory SRS
Authors: Paolo Scardi, Matteo Leoni, G. Cappuccio, J.I. Langford, Robert J. Cernik
207
A New White Beam Powder Diffraction Facility at the Daresbury Laboratory Synchrotron Radiation Source
Authors: S.M. Clark, Robert J. Cernik, A. Grant, S. York, P.A. Atkinson, A. Gallagher, D.G. Stokes, S.R. Gregory, N. Harris, W. Smith, M.H. Hancock, M.C. Miller, K. Ackroyd, R. Farrow, R. Frances, D. O'Hare
213
The High Resolution Powder Diffraction Beam Line at ESRF
Authors: Andy Fitch
219
D2AM: A CRG Beamline at ESRF for Material Science Studies
Authors: J.F. Bérar, J.P. Simon, J.-L. Ferrer, D. Dallé
223
Through-Thickness Strain Scanning Using Synchrotron Radiation
Authors: P.J. Webster, X.D. Wang, G. Mills
227

Showing 31 to 40 of 153 Paper Titles

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