Sims Characterization of Noble Metal-Based Thin Film Electrodes

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Periodical:

Materials Science Forum (Volumes 235-238)

Edited by:

Dino Fiorani and Mauro Magini

Pages:

625-630

DOI:

10.4028/www.scientific.net/MSF.235-238.625

Citation:

C. Piccirillo et al., "Sims Characterization of Noble Metal-Based Thin Film Electrodes", Materials Science Forum, Vols. 235-238, pp. 625-630, 1997

Online since:

October 1996

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$35.00

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