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HomeMaterials Science ForumMaterials Science Forum Vols. 235-238Sims Characterization of Noble Metal-Based Thin...

Sims Characterization of Noble Metal-Based Thin Film Electrodes

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Synthesis and Properties of Mechanically Alloyed and Nanocrystalline Materials

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Periodical:

Materials Science Forum (Volumes 235-238)

Pages:

625-630

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.235-238.625

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Online since:

October 1996

Authors:

Clara Piccirillo, S. Daolio, S. Gelosi, C. Pagura, B. Facchin, J. Kristof

Keywords:

Depth-Profiling, Electrocatalysis, Film Electrode, Iridium Dioxide, Ruthenium Dioxide, Secondary Ion Mass Spectroscopy (SIMS), TiO₂

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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