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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249Progress in Non-Standard Defect Analysis by RBS

Progress in Non-Standard Defect Analysis by RBS

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

327-332

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.327

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Online since:

May 1997

Authors:

K. Gärtner

Keywords:

Dechanneling, Defect Analysis, Point Defect, Rutherford Backscattering

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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