Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction

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Periodical:

Materials Science Forum (Volumes 273-275)

Edited by:

R.A. Schwarzer

Pages:

145-150

DOI:

10.4028/www.scientific.net/MSF.273-275.145

Citation:

I. Tomov "Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction", Materials Science Forum, Vols. 273-275, pp. 145-150, 1998

Online since:

February 1998

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