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HomeMaterials Science ForumMaterials Science Forum Vols. 273-275Secondary Extinction Used in Thickness and Pole...

Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction

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Texture and Anisotropy of Polycrystals

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Periodical:

Materials Science Forum (Volumes 273-275)

Pages:

145-150

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.273-275.145

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Online since:

February 1998

Authors:

I. Tomov

Keywords:

Extinction, Pole Density, Texture, Thickness, Thin Film, X-Ray Diffraction (XRD)

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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