Secondary Extinction Used in Thickness and Pole Density Measurements of Textured Films by X-Ray Diffraction
p.145
p.145
Influence of Slip Activity and Dislocation Reaction on Variant Selection during the γ-to-α Transformation
p.151
p.151
Variant Selection during the γ-to-α' Transformation of a Fe-30%Ni Alloy
p.157
p.157
Tests for Checking the Variant Selection Occurring in the Texture Transformations by Phase Transformations of a Cubic Lattice to a Hexagonal Lattice. Restitution of the Parent Texture from the Inherited Texture
p.163
p.163
Disrete Mesoscale Simulation of Recrystallization Microstructure and Texture Using a Stochastic Cellular Automation Approach
p.169
p.169
A Statistical Approach to Triple Junctions in Polycrystals
p.175
p.175
Crystallographic Analysis of Facets Using Electron Back-Scatter Diffraction
p.183
p.183
Recent Developments in Automated Crystal Orientation Mapping (ACOM) - Quantitative Evaluation and Graphical Representation of Individual Grain Orientation Data
p.191
p.191
A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
p.201
p.201
Disrete Mesoscale Simulation of Recrystallization Microstructure and Texture Using a Stochastic Cellular Automation Approach
Abstract:
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Periodical:
Materials Science Forum (Volumes 273-275)
Pages:
169-174
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Online since:
February 1998
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© 1998 Trans Tech Publications Ltd. All Rights Reserved
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