A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns

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Periodical:

Materials Science Forum (Volumes 273-275)

Edited by:

R.A. Schwarzer

Pages:

201-208

DOI:

10.4028/www.scientific.net/MSF.273-275.201

Citation:

N.C. Krieger Lassen "A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns", Materials Science Forum, Vols. 273-275, pp. 201-208, 1998

Online since:

February 1998

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$35.00

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