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Disrete Mesoscale Simulation of Recrystallization Microstructure and Texture Using a Stochastic Cellular Automation Approach
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A Statistical Approach to Triple Junctions in Polycrystals
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Crystallographic Analysis of Facets Using Electron Back-Scatter Diffraction
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Recent Developments in Automated Crystal Orientation Mapping (ACOM) - Quantitative Evaluation and Graphical Representation of Individual Grain Orientation Data
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A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
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Orientation Imaging in the Transmission Electron Microscope
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Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns
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SAD Pole Figures in Transmission and Reflection Using a High-Grade CCD Camera as an Area Detector
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A Mesoscale Study of the Interaction between Grain Boundaries and the Deformation Field
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HomeMaterials Science ForumMaterials Science Forum Vols. 273-275A New Procedure for Automatic High Precision...

A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns

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Texture and Anisotropy of Polycrystals

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Periodical:

Materials Science Forum (Volumes 273-275)

Pages:

201-208

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.273-275.201

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Online since:

February 1998

Authors:

N.C. Krieger Lassen

Keywords:

Crystal Orientation, Electron Backscatter Diffraction (EBSD), Hough Transform (HT), Image Processing, Pattern Recognition

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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