Paper Titles

A Statistical Approach to Triple Junctions in Polycrystals
p.175

Crystallographic Analysis of Facets Using Electron Back-Scatter Diffraction
p.183

Recent Developments in Automated Crystal Orientation Mapping (ACOM) - Quantitative Evaluation and Graphical Representation of Individual Grain Orientation Data
p.191

A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
p.201

Orientation Imaging in the Transmission Electron Microscope
p.209

Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns
p.215

SAD Pole Figures in Transmission and Reflection Using a High-Grade CCD Camera as an Area Detector
p.223

A Mesoscale Study of the Interaction between Grain Boundaries and the Deformation Field
p.229

Orientationally Resolved Grain Size Distributions in Thin Films
p.237

HomeMaterials Science ForumMaterials Science Forum Vols. 273-275Orientation Imaging in the Transmission Electron...

Orientation Imaging in the Transmission Electron Microscope

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Abstract:

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Texture and Anisotropy of Polycrystals

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Periodical:

Materials Science Forum (Volumes 273-275)

Pages:

209-214

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.273-275.209

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Online since:

February 1998

Authors:

Stuart I. Wright, David J. Dingley

Keywords:

Electron Diffraction (ED), Orientation Imaging, TEM

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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