Crystallographic Analysis of Facets Using Electron Back-Scatter Diffraction
p.183
p.183
Recent Developments in Automated Crystal Orientation Mapping (ACOM) - Quantitative Evaluation and Graphical Representation of Individual Grain Orientation Data
p.191
p.191
A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
p.201
p.201
Orientation Imaging in the Transmission Electron Microscope
p.209
p.209
Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns
p.215
p.215
SAD Pole Figures in Transmission and Reflection Using a High-Grade CCD Camera as an Area Detector
p.223
p.223
A Mesoscale Study of the Interaction between Grain Boundaries and the Deformation Field
p.229
p.229
Orientationally Resolved Grain Size Distributions in Thin Films
p.237
p.237
Determination of the Grain Boundary Misorientation for the Analysis of the Discontinuous Ordering Reaction in Fe-50 at. % Co
p.243
p.243
Automated Crystal Orientation Mapping (ACOM) with a Computer-Controlled TEM by Interpreting Transmission Kikuchi Patterns
Abstract:
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Periodical:
Materials Science Forum (Volumes 273-275)
Pages:
215-222
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Online since:
February 1998
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© 1998 Trans Tech Publications Ltd. All Rights Reserved
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