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A Statistical Approach to Triple Junctions in Polycrystals
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Crystallographic Analysis of Facets Using Electron Back-Scatter Diffraction
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HomeMaterials Science ForumMaterials Science Forum Vols. 273-275A Statistical Approach to Triple Junctions in...

A Statistical Approach to Triple Junctions in Polycrystals

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Texture and Anisotropy of Polycrystals

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Periodical:

Materials Science Forum (Volumes 273-275)

Pages:

175-182

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.273-275.175

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Online since:

February 1998

Authors:

Liang Zuo, Claude Esling, J. Muller, Emmanuel Bouzy

Keywords:

Coincidence Site Lattice, Grain Boundary, Harmonic Method, Triple Junction Statistics

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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