Using Oim to Interpret the Dynamically Recrystallized Texture of a Low Stacking Fault Energy FCC Material

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Periodical:

Materials Science Forum (Volumes 273-275)

Edited by:

R.A. Schwarzer

Pages:

249-254

DOI:

10.4028/www.scientific.net/MSF.273-275.249

Citation:

P. Bocher et al., "Using Oim to Interpret the Dynamically Recrystallized Texture of a Low Stacking Fault Energy FCC Material", Materials Science Forum, Vols. 273-275, pp. 249-254, 1998

Online since:

February 1998

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$35.00

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