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HomeMaterials Science ForumMaterials Science Forum Vols. 273-275In Situ Recrystallization of Copper Studied by...

In Situ Recrystallization of Copper Studied by Individual Grain Orientation Measurement in the SEM

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Texture and Anisotropy of Polycrystals

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Periodical:

Materials Science Forum (Volumes 273-275)

Pages:

497-502

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.273-275.497

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Online since:

February 1998

Authors:

F. Springer, M. Radomski

Keywords:

ACOM, Aggregate Function, Automated Crystal Orientation Mapping, Backscatter Kikuchi Diffraction (BKD), BKD, Crystal Growth, Electron Backscatter Diffraction (EBSD), Heating Experiments in the SEM

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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