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Development of the Statistical Theory of Grain Growth for the General Case of Non-Uniform Grain Boundaries and Textures
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Textures of Thin Films
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Treatment of Elastic and Plastic Anisotropy of Polycrystalline Materials with Texture
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The Two-Dimensional Orientation Distribution of Planar Microstructural Features
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Processing Indiviual Orientation Data to Calculate ODFs
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Sampling Error of Texture Approximation by Individual Orientation Measurement
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Optimization of Texture Measurements. III. Statistical Relevance of ODF Represented by Individual Orientations
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ODF Computer Program for High-Resolution Texture Analysis of Low-Symmetry Materials
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An Automated Component Method
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HomeMaterials Science ForumMaterials Science Forum Vols. 273-275Processing Indiviual Orientation Data to Calculate...

Processing Indiviual Orientation Data to Calculate ODFs

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Texture and Anisotropy of Polycrystals

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Periodical:

Materials Science Forum (Volumes 273-275)

Pages:

89-98

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.273-275.89

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Online since:

February 1998

Authors:

Francis Wagner, Siegfried Matthies, O. Van Landuyt

Keywords:

BKD, Electron Backscatter Diffraction (EBSD), Electron Backscattered Pattern (EBSP), Individual Orientation, ODF, Texture Index

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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