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HomeMaterials Science ForumMaterials Science Forum Vols. 294-296Auger Spectroscopy of TiAl Interface Diffusion...

Auger Spectroscopy of TiAl Interface Diffusion Specimens

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Intergranular and Interphase Boundaries in Materials III

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Periodical:

Materials Science Forum (Volumes 294-296)

Pages:

389-392

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.294-296.389

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Online since:

November 1998

Authors:

D.E. Luzzi, D. Imamura, Haruyuki Inui, E.P. George, L. Heatherly, Hiroyuki Y. Yasuda, H. Mori, Masaharu Yamaguchi

Keywords:

Auger Electron Spectroscopy (AES), Interface Diffusion, TiAl

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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