Continuing the scope of the preceding Conferences on Intergranular and Interphase Boundaries in Materials, the present conference focused on the atomic-level modeling of interfaces, the structural and chemical characterization of internal interfaces, on their thermodynamic, kinetic, mechanical, electrical, magnetic behavior and high-Tc superconductivity, and on the application of current knowledge to the design of polycrystalline materials having improved properties. Particular attention was paid to non-equilibrium segregation in irradiated materials.
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eBook:

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ToC:

Table of contents

Editors:

Pavel Lejcek and Václav Paidar

DOI:

https://doi.org/10.4028/b-7SOW1h

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Aluminum (Al), Bi-Crystal, Copper (Cu), Electron Microscopy, Grain Boundary, Grain Boundary Core, Grain Boundary Diffusion, Grain Boundary Dislocation, Grain Boundary Migration, High Resolution Electron Microscopy (HREM), High Resolution Transmission Electron Microscopy, Interface, Interphase Boundaries, Irradiation, Metal, Segregation, Silicon, Silicon Carbide (SiC), Surface Segregation, TEM

Details:

Proceedings of the 9th International Conference on Intergranular and Interphase Boundaries in Materials (iib 98), held in Prague, Czech Republic, July 1998

Pages:

840

Year:

1999

ISBN-13:

9780878498239

ISBN-13 (CD):

9783038598510

ISBN-13 (eBook):

9783035705355

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