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HomeMaterials Science ForumMaterials Science Forum Vols. 297-298Optical Probing of Ultrafast Devices

Optical Probing of Ultrafast Devices

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Ultrafast Phenomena in Semiconductors

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Periodical:

Materials Science Forum (Volumes 297-298)

Pages:

59-66

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.297-298.59

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Online since:

December 1998

Authors:

H.G. Roskos, Tilo Pfeifer, H.-M. Heiliger, T. Löffler, H. Kurz

Keywords:

Electrical Waveguides, Electrooptic Probing, Optoelectronic Circuit Characterization, Photoconductive Probing

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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