Atom-Scale Characterization of Ordered Alloys with Atom-Probe Field-Ion Microscope

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Periodical:

Materials Science Forum (Volumes 304-306)

Edited by:

T. Sakuma, T. Aizawa, K. Higashi

Pages:

139-146

DOI:

10.4028/www.scientific.net/MSF.304-306.139

Citation:

M. Yamamoto "Atom-Scale Characterization of Ordered Alloys with Atom-Probe Field-Ion Microscope", Materials Science Forum, Vols. 304-306, pp. 139-146, 1999

Online since:

February 1999

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$35.00

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