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Growth Control and Properties of Si Nanograins Embedded in either Amorphous Silicon or SiO2 Matrix

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Periodical:

Materials Science Forum (Volume 307)

Pages:

177-184

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.307.177

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Online since:

March 1999

Authors:

Richard Rizk

Keywords:

Infrared Spectroscopy, Nanocrystallisation, Nanoscale Size Effects, Photoluminescence (PL), Raman Spectroscopy, Si Nanograins, Si/SiO2, Tunneling Conductivity

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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