Handling of Unusual Instrumental Profiles by the BGMN Rietveld Program

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Periodical:

Materials Science Forum (Volumes 321-324)

Edited by:

R. Delhez, E.J. Mittemeijer

Pages:

192-197

DOI:

10.4028/www.scientific.net/MSF.321-324.192

Citation:

J. Bergmann et al., "Handling of Unusual Instrumental Profiles by the BGMN Rietveld Program", Materials Science Forum, Vols. 321-324, pp. 192-197, 2000

Online since:

January 2000

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$35.00

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