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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324Handling of Unusual Instrumental Profiles by the...

Handling of Unusual Instrumental Profiles by the BGMN Rietveld Program

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

192-197

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.192

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Online since:

January 2000

Authors:

J. Bergmann, P. Friedel, R. Kleeberg

Keywords:

BGMN, Line Profiles, Monte Carlo Raytracing, Rietveld Refinement, X-Ray Diffraction (XRD)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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