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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324Evaluation of High-Resolution SANS Measurements in...

Evaluation of High-Resolution SANS Measurements in Multiple Scattering Regime

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

270-275

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.270

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Online since:

January 2000

Authors:

Jan Šaroun, Pavel Strunz, S. Borbély, J. Ilavský, B. Kolman

Keywords:

Multiple Scattering, Porosity, Small Angle Scattering

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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