Neutron Reflectivity, a Tool for Thin Film Characterization

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 321-324)

Edited by:

R. Delhez, E.J. Mittemeijer

Pages:

246-257

DOI:

10.4028/www.scientific.net/MSF.321-324.246

Citation:

A. Menelle "Neutron Reflectivity, a Tool for Thin Film Characterization", Materials Science Forum, Vols. 321-324, pp. 246-257, 2000

Online since:

January 2000

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.