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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324Quantitative Analysis of Energetic Materials with...

Quantitative Analysis of Energetic Materials with X-Ray Diffraction and Rietveld Refinement

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

60-65

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.60

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Online since:

January 2000

Authors:

M. Herrmann, W. Engel

Keywords:

Accuracy, Energetic Material, Quantitative Analysis, Rietveld Method

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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