Quantitative Analysis of Energetic Materials with X-Ray Diffraction and Rietveld Refinement

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Periodical:

Materials Science Forum (Volumes 321-324)

Edited by:

R. Delhez, E.J. Mittemeijer

Pages:

60-65

DOI:

10.4028/www.scientific.net/MSF.321-324.60

Citation:

M. Herrmann and W. Engel, "Quantitative Analysis of Energetic Materials with X-Ray Diffraction and Rietveld Refinement", Materials Science Forum, Vols. 321-324, pp. 60-65, 2000

Online since:

January 2000

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$35.00

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