Paper Titles

Powder and Single-Crystal X-Ray Structural Refinement on a Natural Chromite: Dependence of Site Occupancies on Experimental Strategies
p.46

Quantitative Phase Analysis: Rietveld Method Versus Full-Pattern Method with Whole Observed Standard Profiles
p.54

Quantitative Analysis of Energetic Materials with X-Ray Diffraction and Rietveld Refinement
p.60

Analysis of Residual Stress States
p.66

X-Ray Residual Stress Gradient Analysis under Difficult Conditions - Attempts for Improving Solution
p.75

X-Ray Analysis of Residual Stresses and Stress-Free Lattice Parameters in Thin Gradient Coatings
p.81

Extinction Study of Dislocations (Bragg Diffraction)
p.87

Characterisation of Dislocation Types in a Plastically Deformed Aluminium Base Alloy
p.92

Calculation of Diffraction Patterns of Close-Packed Polytypes with Random Shearing Stacking Faults
p.97

HomeMaterials Science ForumMaterials Science Forum Vols. 321-324X-Ray Residual Stress Gradient Analysis under...

X-Ray Residual Stress Gradient Analysis under Difficult Conditions - Attempts for Improving Solution

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction 6$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

75-80

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.75

Citation:

Cite this paper

Online since:

January 2000

Authors:

Christoph Genzel, Walter Reimers

Keywords:

Residual Stress Gradients, Surface Processing, Texture, Thin Film

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2000 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: