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HomeMaterials Science ForumMaterials Science Forum Vols. 321-324X-Ray Diffraction Characterization of Thermally...

X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder

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Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

762-767

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.762

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Online since:

January 2000

Authors:

Giora Kimmel, David Dayan, Jacob Zabicky

Keywords:

Aluminum (Al), Boehmite, Corundum, Crystallite Size, Lattice Strains, Line Broadening, Line Profile Analysis, Microstrain, Powder, Sol-Gel (SG), Thermal Annealing, Warren-Averbach Analysis, Williamson-Hall Method, X-Ray Diffraction (XRD)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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