X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 321-324)

Edited by:

R. Delhez, E.J. Mittemeijer

Pages:

762-767

DOI:

10.4028/www.scientific.net/MSF.321-324.762

Citation:

G. Kimmel et al., "X-Ray Diffraction Characterization of Thermally Annealed Nanometric Alumina Powder", Materials Science Forum, Vols. 321-324, pp. 762-767, 2000

Online since:

January 2000

Export:

Price:

$35.00

In order to see related information, you need to Login.