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Effect of Y2O3 Content on Sintering of Aluminum Nitride
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Characterisation and Crystallisation of La-Oxynitride Glass
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Preparation and Characterisation of Iw-Phase in the Y-Si-AI-O-N System
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Effect of Y2O3 Content on Sintering of Aluminum Nitride

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Periodical:

Materials Science Forum (Volumes 325-326)

Pages:

249-254

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.325-326.249

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Online since:

January 2000

Authors:

Robin A.L. Drew, Y. Baik, M. Entezarian

Keywords:

Aluminum Nitride (AlN), Electronic Substrates, Sintering, Thermal Conductivity (TC)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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