Effect of Ti Content on Nanometric Substructure and Shape Memory Property in Sputter-Deposited Ti-Rich Ti-Ni Thin Films

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 327-328)

Edited by:

Toshio Saburi

Pages:

175-178

Citation:

T. Matsunaga et al., "Effect of Ti Content on Nanometric Substructure and Shape Memory Property in Sputter-Deposited Ti-Rich Ti-Ni Thin Films", Materials Science Forum, Vols. 327-328, pp. 175-178, 2000

Online since:

January 2000

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.