Effect of Ti Content on Nanometric Substructure and Shape Memory Property in Sputter-Deposited Ti-Rich Ti-Ni Thin Films

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Periodical:

Materials Science Forum (Volumes 327-328)

Edited by:

Toshio Saburi

Pages:

175-178

DOI:

10.4028/www.scientific.net/MSF.327-328.175

Citation:

T. Matsunaga et al., "Effect of Ti Content on Nanometric Substructure and Shape Memory Property in Sputter-Deposited Ti-Rich Ti-Ni Thin Films", Materials Science Forum, Vols. 327-328, pp. 175-178, 2000

Online since:

January 2000

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$35.00

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