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HomeMaterials Science ForumMaterials Science Forum Vols. 347-349Residual Stresses in Polycrystalline Thin Films

Residual Stresses in Polycrystalline Thin Films

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Residual Stress ECRS 5

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Periodical:

Materials Science Forum (Volumes 347-349)

Pages:

399-404

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.347-349.399

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Online since:

May 2000

Authors:

Paolo Scardi, Yu Hui Dong

Keywords:

Residual Stress, Stress Gradients, Texture, Thin Film, X-Ray Elastic Constant (XEC)

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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