Positron Beam Studies of Defects in Semiconductors

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Periodical:

Materials Science Forum (Volumes 363-365)

Edited by:

Werner Triftshäuser, Gottfried Kögel and Peter Sperr

Pages:

404-408

Citation:

R. Krause-Rehberg et al., "Positron Beam Studies of Defects in Semiconductors", Materials Science Forum, Vols. 363-365, pp. 404-408, 2001

Online since:

April 2001

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$38.00

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