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HomeMaterials Science ForumMaterials Science Forum Vols. 363-365Positron Beam Studies of Defects in Semiconductors

Positron Beam Studies of Defects in Semiconductors

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Periodical:

Materials Science Forum (Volumes 363-365)

Pages:

404-408

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.363-365.404

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Online since:

April 2001

Authors:

Reinhard Krause-Rehberg, F. Börner, F. Redmann

Keywords:

Defect Studies, Enhanced Depth Resolution, Positron Beams, VEPAS

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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