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HomeMaterials Science ForumMaterials Science Forum Vols. 373-376Interfaces of Fe/Si Multilayered Films Analysed by...

Interfaces of Fe/Si Multilayered Films Analysed by Optical Spectroscopy

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Periodical:

Materials Science Forum (Volumes 373-376)

Pages:

161-164

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.373-376.161

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Online since:

August 2001

Authors:

Yu.V. Kudryavtsev, Y.P. Lee, K.W. Kim, J.Y. Rhee, J. Dubowik, B. Szymanski, Feliks Stobiecki

Keywords:

Fe/Si, Interface, Multilayer, Optical Property

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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