High-Temperature Double-Crystal X-Ray Diffractometer for In-Situ Studies, the Hotbird

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Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

206-211

DOI:

10.4028/www.scientific.net/MSF.378-381.206

Citation:

A.D. Sequeira et al., "High-Temperature Double-Crystal X-Ray Diffractometer for In-Situ Studies, the Hotbird", Materials Science Forum, Vols. 378-381, pp. 206-211, 2001

Online since:

October 2001

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$35.00

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