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European Powder Diffraction EPDIC 7
Subtitle:
EPDIC 7
Description:
Volume is indexed by Thomson Reuters CPCI-S (WoS).
X-ray powder diffraction is a non-destructive technique widely applied for the characterisation of crystalline materials. The method has been traditionally used for phase identification, quantitative analysis and the determination of structure imperfections. In recent years, applications have been extended to new areas, such as the determination of crystal structures and the extraction of three-dimensional microstructural properties.
X-ray powder diffraction is a non-destructive technique widely applied for the characterisation of crystalline materials. The method has been traditionally used for phase identification, quantitative analysis and the determination of structure imperfections. In recent years, applications have been extended to new areas, such as the determination of crystal structures and the extraction of three-dimensional microstructural properties.
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Info:
eBook:
ToC:
Editors:
R. Delhez and E.J. Mittemeijer
THEMA:
TGM
BISAC:
TEC021000
Keywords:
Crystallite Size, Dislocation, Ferrite, High-Pressure, Line Profile Analysis, Magnetic Ordering, Magnetic Structures, Neutron Diffraction, Phase Transition, Powder Diffraction, Powder Pattern Indexing, Residual Stress, Rietveld, Rietveld Refinement, Simulated Annealing (SA), Structure Solution, Texture, Thin Film, X-Ray Diffraction (XRD), X-Ray Powder Diffraction
Details:
Proceedings of the 7th European Powder Diffraction Conference, Barcelona, Spain, May 20-23, 2000
Pages:
880
Year:
2001
ISBN-13 (softcover):
9780878498864
ISBN-13 (CD):
9783038598800
ISBN-13 (eBook):
9783035705645
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