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Diffusion Foundations and Materials Applications
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Books by Keyword: Rietveld Refinement
Books
Edited by:
Danuta Stróż and Grzegorz Dercz
Online since: June 2013
Description: The goal of this collection is to provide the opportunity for researchers working in many different fields to showcase their latest achievements in the arena of structural studies, as applied to the materials commonly used in industry. Emphasis is placed on the methods and techniques used in structural studies, as well as on the structures and properties of divers materials including: metals and alloys, ceramics, polymers, quasicrystals, nanomaterials and thin films.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The book comprises 98 peer-reviewed papers which provide excellent up-to-date coverage of the subject.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The book comprises 98 peer-reviewed papers which provide excellent up-to-date coverage of the subject.
Edited by:
Paolo Scardi and Robert E. Dinnebier
Online since: May 2010
Description: Volume is indexed by Thomson Reuters BCI (WoS).
The main focus of this special topic volume is the development and possibilities of the MACRO language within TOPAS, with a specific session dedicated to WPPM. The collection is presented here in the form of a “macro tutorial” for the benefit of the entire powder diffraction community. More than a collection of standard scientific papers, the contributions to this special issue provide methods, tutorials and practical suggestions and solutions for the proper use of TOPAS and WPPM in a number of applications; ranging from the most common to the most refined and specific cases.
The main focus of this special topic volume is the development and possibilities of the MACRO language within TOPAS, with a specific session dedicated to WPPM. The collection is presented here in the form of a “macro tutorial” for the benefit of the entire powder diffraction community. More than a collection of standard scientific papers, the contributions to this special issue provide methods, tutorials and practical suggestions and solutions for the proper use of TOPAS and WPPM in a number of applications; ranging from the most common to the most refined and specific cases.
Edited by:
Y. Andersson, Prof. Eric Jan Mittemeijer and U. Welzel
Online since: January 2004
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
X-ray powder diffraction is a long-established and invaluable technique which is widely applied to the characterization of crystalline materials. The method has traditionally been used for phase identification, quantitative analysis and for the determination of structural imperfections. In recent years however, its use has been extended into exciting new areas such as the extraction of three-dimensional microstructural properties.
X-ray powder diffraction is a long-established and invaluable technique which is widely applied to the characterization of crystalline materials. The method has traditionally been used for phase identification, quantitative analysis and for the determination of structural imperfections. In recent years however, its use has been extended into exciting new areas such as the extraction of three-dimensional microstructural properties.
Edited by:
R. Delhez and E.J. Mittemeijer
Online since: October 2001
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
X-ray powder diffraction is a non-destructive technique widely applied for the characterisation of crystalline materials. The method has been traditionally used for phase identification, quantitative analysis and the determination of structure imperfections. In recent years, applications have been extended to new areas, such as the determination of crystal structures and the extraction of three-dimensional microstructural properties.
X-ray powder diffraction is a non-destructive technique widely applied for the characterisation of crystalline materials. The method has been traditionally used for phase identification, quantitative analysis and the determination of structure imperfections. In recent years, applications have been extended to new areas, such as the determination of crystal structures and the extraction of three-dimensional microstructural properties.
Edited by:
R. Delhez, E.J. Mittemeijer
Online since: January 2000
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The proceedings of the 6th European Conference on Powder iffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). Chapters on Method Development, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction offer new ideas on subjects as Microstructure of Materials, Determination of Crystallographic Structure, Quantitative Phase Analysis, and Texture & Coarse Grains. Developments in analysis using the X-ray lens –a bundle of glass capillaries- and single or double X-ray mirrors continue.
The proceedings of the 6th European Conference on Powder iffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). Chapters on Method Development, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction offer new ideas on subjects as Microstructure of Materials, Determination of Crystallographic Structure, Quantitative Phase Analysis, and Texture & Coarse Grains. Developments in analysis using the X-ray lens –a bundle of glass capillaries- and single or double X-ray mirrors continue.
Edited by:
R. Delhez and E.J. Mittemeijer
Online since: April 1998
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis.
Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.
The EPDIC-5 Proceedings present the latest papers in this successful series of European Conferences on Powder Diffraction. They demonstrate the evergrowing interest from materials scientists, physicists, chemists, geologists - both industrial and academic- all having a direct interest in the practical application of this powerful and non-destructive method of analysis.
Part 1 comprises some 75 contributions, with sections on Methodological Developments, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction describing the latest ideas in these fields. Subjects such as Microstructure of Materials, Texture, Quantitative Phase Analysis and Crystal Structure Determination are also addressed; as in previous editions of these conference proceedings. An important step forward in materials analysis is now occurring: scientists and engineers are becoming more and more conscious of the fact that, by using these techniques, it is possible to obtain quantitative information from the same set of measurements, of material characteristics, that determine material properties. This advance has been made possible thanks to recent instrumental developments, such as the X-ray lens -a bundle of glass capillaries- and single or double X-ray mirrors. A very useful tool, that is extensively applied -as described in a sequence of some 15 contributions-, is the in-situ (i.e. time resolved) powder diffraction technique which has resulted from the ample availability of position sensitive detectors.
Edited by:
Robert J. Cernik, R. Delhez and Prof. Eric Jan Mittemeijer
Online since: July 1996
Description: This comprehensive publication presents most recent results, and covers practically all aspects of powder diffraction. Part 1 contains contributions dealing with powder diffraction methods, and the larger second part comprises contributions which deal with the application of powder-diffraction methods to specific problems in the physics and chemistry of solids.
Showing 1 to 7 of 7 Books