Volume is indexed by Thomson Reuters CPCI-S (WoS).
X-ray powder diffraction is a long-established and invaluable technique which is widely applied to the characterization of crystalline materials. The method has traditionally been used for phase identification, quantitative analysis and for the determination of structural imperfections. In recent years however, its use has been extended into exciting new areas such as the extraction of three-dimensional microstructural properties.

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eBook:

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ToC:

Table of contents

Editors:

Y. Andersson, Prof. Eric Jan Mittemeijer and U. Welzel

DOI:

https://doi.org/10.4028/b-n29XTl

THEMA:

TGM

BISAC:

TEC021000

Keywords:

Crystal Structure, Neutron Diffraction, Neutron Powder Diffraction, Rietveld Refinement, Texture, X-Ray Diffraction (XRD)

Details:

Proceedings of the 8th European Powder Diffraction Conference, Uppsala, Sweden, May 23-26, 2002

Pages:

430

Year:

2004

ISBN-13 (softcover):

9780878499359

ISBN-13 (CD):

9783038599371

ISBN-13 (eBook):

9783035706215

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