Books by Keyword: Line Profile Analysis

Books

Edited by: Paolo Scardi and Robert E. Dinnebier
Online since: May 2010
Description: Volume is indexed by Thomson Reuters BCI (WoS).
The main focus of this special topic volume is the development and possibilities of the MACRO language within TOPAS, with a specific session dedicated to WPPM. The collection is presented here in the form of a “macro tutorial” for the benefit of the entire powder diffraction community. More than a collection of standard scientific papers, the contributions to this special issue provide methods, tutorials and practical suggestions and solutions for the proper use of TOPAS and WPPM in a number of applications; ranging from the most common to the most refined and specific cases.
Edited by: R. Delhez and E.J. Mittemeijer
Online since: October 2001
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
X-ray powder diffraction is a non-destructive technique widely applied for the characterisation of crystalline materials. The method has been traditionally used for phase identification, quantitative analysis and the determination of structure imperfections. In recent years, applications have been extended to new areas, such as the determination of crystal structures and the extraction of three-dimensional microstructural properties.
Edited by: R. Delhez, E.J. Mittemeijer
Online since: January 2000
Description: Volume is indexed by Thomson Reuters CPCI-S (WoS).
The proceedings of the 6th European Conference on Powder iffraction cover 191 papers in the areas of X-ray and neutron diffraction (36 papers). Chapters on Method Development, Development of Instruments and Techniques, Software, Synchrotron and Neutron Diffraction offer new ideas on subjects as Microstructure of Materials, Determination of Crystallographic Structure, Quantitative Phase Analysis, and Texture & Coarse Grains. Developments in analysis using the X-ray lens –a bundle of glass capillaries- and single or double X-ray mirrors continue.
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