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HomeMaterials Science ForumMaterials Science Forum Vols. 378-381X-Ray Diffraction Study of Cu25[AsSe1.4I0.2]75...

X-Ray Diffraction Study of Cu₂₅[AsSe_1.4I_0.2]₇₅ Amorphous Semiconductor

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Periodical:

Materials Science Forum (Volumes 378-381)

Pages:

394-401

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.378-381.394

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Online since:

October 2001

Authors:

Á. Bordás, M. Vučinić, A. Kapor, B. Antić

Keywords:

Amorphous Semiconductor, Radial Distribution Function (RDF), Short Range Order (SRO), Structure Factor SF

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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