In-Situ Analysis of Microstress and Texture Development during Tensile Deformation of MMCs at Room Temperature and at Elevated Temperatures Using Synchrotron Radiation

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Periodical:

Materials Science Forum (Volumes 404-407)

Edited by:

A.M. Dias, J. Pina, A.C. Batista and E. Diogo

Pages:

535-540

DOI:

10.4028/www.scientific.net/MSF.404-407.535

Citation:

A. Pyzalla et al., "In-Situ Analysis of Microstress and Texture Development during Tensile Deformation of MMCs at Room Temperature and at Elevated Temperatures Using Synchrotron Radiation", Materials Science Forum, Vols. 404-407, pp. 535-540, 2002

Online since:

August 2002

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