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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407

Materials Science Forum Vols. 404-407

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407

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Table of Contents

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Paper Title Page

Preface

Residual Strain Measurement by Synchrotron Diffraction

Authors: Philip J. Withers, Michael Preuss, P.J. Webster, D.J. Hughes, Alexander M. Korsunsky

1

Problems Related to Energy-Dispersive X-Ray Stress Analysis Performed in Reflection Geometry

Authors: Carsten Stock, Christoph Genzel, Walter Reimers

13

Global X-Ray Method for the Determination of Stress Profiles

Authors: Jean Michel Sprauel, H. Michaud

19

The Influence of Surface Roughness on the Refraction Correction of Bragg Peak Positions

Authors: Michael Ott, Detlef Löhe

25

Application of Non-linear Sin²ψ Method for Stress Determination Using X-Ray Diffraction

Authors: Andrzej Baczmanski, R.J. Lark, S.J. Skrzypek

29

Assumptions in Thin Film Residual Stress Methods

Authors: Arnold C. Vermeulen

35

Residual Stresses Near Holes in Tempered Glass Plates

Authors: Laurent Daudeville, Frédéric Bernard, René Gy

43

Residual Stresses in Bulk Metallic Glasses – I: Modeling

Authors: Cahit Can Aydiner, Ersan Üstündag

49

Modelling of the Relaxation Behaviour of Carbide-Hardened Superalloys

Authors: U. Martin, H. Oettel, U. Mühle

55

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