Preface
Residual Strain Measurement by Synchrotron Diffraction
p.1
p.1
Problems Related to Energy-Dispersive X-Ray Stress Analysis Performed in Reflection Geometry
p.13
p.13
Global X-Ray Method for the Determination of Stress Profiles
p.19
p.19
The Influence of Surface Roughness on the Refraction Correction of Bragg Peak Positions
p.25
p.25
Application of Non-linear Sin2ψ Method for Stress Determination Using X-Ray Diffraction
p.29
p.29
Assumptions in Thin Film Residual Stress Methods
p.35
p.35
Residual Stresses Near Holes in Tempered Glass Plates
p.43
p.43
Residual Stresses in Bulk Metallic Glasses – I: Modeling
p.49
p.49
Preface
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 404-407)
Online since:
August 2002
Сopyright:
© 2002 Trans Tech Publications Ltd. All Rights Reserved
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