Paper Titles

Problems Related to Energy-Dispersive X-Ray Stress Analysis Performed in Reflection Geometry
p.13

Global X-Ray Method for the Determination of Stress Profiles
p.19

The Influence of Surface Roughness on the Refraction Correction of Bragg Peak Positions
p.25

Application of Non-linear Sin²ψ Method for Stress Determination Using X-Ray Diffraction
p.29

Assumptions in Thin Film Residual Stress Methods
p.35

Residual Stresses Near Holes in Tempered Glass Plates
p.43

Residual Stresses in Bulk Metallic Glasses – I: Modeling
p.49

Modelling of the Relaxation Behaviour of Carbide-Hardened Superalloys
p.55

Characterization of Machining Distortion by Strain Energy Density and Stress Range
p.61

HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Assumptions in Thin Film Residual Stress Methods

Assumptions in Thin Film Residual Stress Methods

Article Preview

Abstract:

You might also be interested in these eBooks

Residual Stresses VI, ECRS6

Info:

Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

35-42

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.35

Citation:

Cite this paper

Online since:

August 2002

Authors:

Arnold C. Vermeulen

Keywords:

Assumption Analysis, g(ψ) Method, Stress Method, Thin Film, X-Ray Diffraction (XRD)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2002 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: