Characterization of Fiber/Matrix Interfaces Using X-Ray Microtopography

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Periodical:

Materials Science Forum (Volumes 404-407)

Edited by:

A.M. Dias, J. Pina, A.C. Batista and E. Diogo

Pages:

919-924

DOI:

10.4028/www.scientific.net/MSF.404-407.919

Citation:

J.C. Hanan et al., "Characterization of Fiber/Matrix Interfaces Using X-Ray Microtopography", Materials Science Forum, Vols. 404-407, pp. 919-924, 2002

Online since:

August 2002

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$35.00

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