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HomeMaterials Science ForumMaterials Science Forum Vols. 408-412Orientation Correction Method of Distorted Samples...

Orientation Correction Method of Distorted Samples during in situ Deformations Using a High Resolution EBSD

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Textures of Materials - ICOTOM 13

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Periodical:

Materials Science Forum (Volumes 408-412)

Pages:

203-208

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.408-412.203

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Online since:

August 2002

Authors:

Jun Hyun Han, Suk Min Baeck, Kyu Hwan Oh, Young Hoon Chung

Keywords:

Electron Backscatter Diffraction (EBSD), In Situ Deformation, Orientation Correction

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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