Advanced Characterization of Twins Using Automated Electron Backscatter Diffraction

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 408-412)

Edited by:

Dong Nyung Lee

Pages:

511-516

Citation:

S. I. Wright et al., "Advanced Characterization of Twins Using Automated Electron Backscatter Diffraction", Materials Science Forum, Vols. 408-412, pp. 511-516, 2002

Online since:

August 2002

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.