Investigation of Creep Microcavities by Scanning Electron Microscope

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Periodical:

Materials Science Forum (Volumes 414-415)

Edited by:

J. Gyulai

Pages:

183-188

DOI:

10.4028/www.scientific.net/MSF.414-415.183

Citation:

L. Dévényi and T. Biro, "Investigation of Creep Microcavities by Scanning Electron Microscope", Materials Science Forum, Vols. 414-415, pp. 183-188, 2003

Online since:

January 2003

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$35.00

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