Studies of the Positron Lifetime and Doppler Broadening Annihilation Radiation of Polyvinyl Chloride Doped with Al2O3

Hamdy F.M. Mohamed; E.E. Abdel-Hady; H.B. Alaa

doi:10.4028/www.scientific.net/MSF.445-446.328

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Two Types of Lamellar Phase in TTAB/Water/Pentanol System as Detected by Positron Lifetime Spectroscopy
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The Depth Profile of Free Volume in Drug Delivery Polymers Studied by Positron Annihilation Spectroscopy
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Corona Treated Polydimethylsiloxane (PDMS) Surfaces Studied by the Slow Positron Beam Technique
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The Effect of Plasticizer on the Free Volume in Metolose Systems
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Studies of the Positron Lifetime and Doppler Broadening Annihilation Radiation of Polyvinyl Chloride Doped with Al₂O₃
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Formation of Positronium in Cup-Stacked Carbon Nanofibers
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Positronium Annihilation Lifetime Spectroscopy of Porous Low-k Films with Periodic Pore Structures
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Studies of the Positron Lifetime and Doppler Broadening Annihilation Radiation of Polyvinyl Chloride Doped with Al₂O₃

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Materials Science Forum (Volumes 445-446)

Pages:

328-330

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.328

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Online since:

January 2004

Authors:

Hamdy F.M. Mohamed, E.E. Abdel-Hady, H.B. Alaa

Keywords:

Conductivity, Dielectric, Free Volume Hole, Poly(vinyl chloride), Positron Annihilation

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References

[1] I. Prochazka, Materials Structure 8 (2001), p.55.

Google Scholar

[2] E. E. Abdel-Hady and H. F. M. Mohamed, Polymer Degradation and Stability 77 (2002), p.449.

Google Scholar

[3] P. Kirkegaard, M. Eldrup, O. E. Mogensen and N. Pedersen, Comput. Phys. Commu. 23, (1981), p.307: and PATFIT 88 (1988) version.

Google Scholar

[4] T. Hirade and O.E. Mogensen, Chem. Phys. 170, (1993), p.294.

Google Scholar

[5] B. C. Shekar, V. Veeravazhuthi, S. Sakthivel, D. Mangalaraj, and Sa.K. Narayandass, Thin Solid Films 348 (1999), p.122.

DOI: 10.1016/s0040-6090(99)00027-9

Google Scholar

[6] M. D. Migahed, N. A. Bakr, M. I. Abdel-Hamid, O. El-Hanafy, and M. El-Nimr, J. Appl. Poly. Sci. 59 (1996), p.655.

DOI: 10.1002/(sici)1097-4628(19960124)59:4<655::aid-app11>3.0.co;2-p

Google Scholar

[7] N. Balasundram, D. Mangalaraj, Sa.K. Narayandass, C. Balasubramanian, Phys. Stat Solidi (a) 130 (1992), p.141.

Google Scholar

[8] A. K. Jonscher, “Dielectric relaxation in solids”, Chelsea Dielectrics Press Ltd., London (1983).

Google Scholar