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HV Design of a Pulsed Lifetime Beam with a Grounded Sample
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Long Term Performance of the Reactor Based Positron Beam POSH
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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Reliability Test of a PAL Spectrometer - Selected...

Reliability Test of a PAL Spectrometer - Selected Results on Fe

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

495-497

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.495

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Online since:

January 2004

Authors:

S. May-Tal Beck, Gerhard Brauer, W. Anwand, Z. Berant, O. Shahal, M. Ganor, I. Israelashwily

Keywords:

Defect, Iron, Positron Lifetime Spectroscopy, Slow Positron Implantation Spectroscopy

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[2] Positron Annihilation in Semiconductors – Defect Studies, edited by R. Krause-Rehberg and H.S. Leipner (Springer, Berlin, 1999).

DOI: 10.1007/978-3-662-03893-2_8

[3] P. Kirkegaard, N.J. Pedersen and M. Eldrup: Tech. Rep. Riso-M-2740, Riso Nat. Lab., Roskilde (Denmark) (1989).

[4] W. Anwand, H. -R. Kissener and G. Brauer: Acta Phys. Pol. A 88 (1995) 7.

[5] A. vanVeen, H. Schut, J. deVries, R.A. Hakvoort and M.R. Ijpma, in: Positron beams for solids and surfaces, Ed. P.J. Schultz, G.R. Massoumi, P.J. Simpson, American Institute of Physics, New York 1990, p.171.

[6] M. Eldrup and B.N. Singh: Journal of Nuclear Materials 276 (2000) 269.