Measurements of Magnetic Compton Profiles of Amorphous Fe-Tb Thin Films Using Circularly Polarized X-Rays

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Periodical:

Materials Science Forum (Volumes 449-452)

Edited by:

S.-G. Kang and T. Kobayashi

Pages:

1073-1076

DOI:

10.4028/www.scientific.net/MSF.449-452.1073

Citation:

C. W. Kim et al., "Measurements of Magnetic Compton Profiles of Amorphous Fe-Tb Thin Films Using Circularly Polarized X-Rays", Materials Science Forum, Vols. 449-452, pp. 1073-1076, 2004

Online since:

March 2004

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$35.00

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