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The Effect of Various Parameters on the Structure of W-Ti Thin Films

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Periodical:

Materials Science Forum (Volumes 453-454)

Pages:

55-60

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.453-454.55

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Online since:

May 2004

Authors:

S. Petrović, B. Gaković, Z. Rakočević, T. Nenadović

Keywords:

STM, Thin Film, Tungsten-Titanium Alloy, X-Ray Diffraction (XRD)

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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References

[1] T. Nenadovic, Materials Snience Forum, 214, 163 (1996).

Google Scholar

[2] C. Louro and A. Cavaleiro, J. Electrochem. Soc., 144, No 1, 259 (1997).

Google Scholar

[3] J. M. Oparowski, R. D. Sisson and R. R. Biederman, Thin Solid Films, 153, 313 (1987).

Google Scholar

[4] L. Sangaletti, E. Bontempi, L. E. Depero, R. Salari and M. Zocchi, J. Mater. Res., 13, No 6, 1568 (1998).

Google Scholar

[5] M. Di Giulio, D. Manno, G. Micocci, A. Serra and A. Tepore, J. Mater. Scien.: Materials in Electronics, 9, 317 (1998).

DOI: 10.1023/a:1008889009741

Google Scholar

[6] K. Reichelt, Vacuum, 38, No 12, 1083 (1988).

Google Scholar